Last edited by Moogulkis
Sunday, July 26, 2020 | History

5 edition of Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits found in the catalog.

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

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  • 5 Currently reading

Published by IEEE Standards Office .
Written in English

    Subjects:
  • Circuits & components,
  • Electronic devices & materials,
  • Electronics - Circuits - General,
  • Electronics - Circuits - Integrated,
  • Quality Control,
  • Integrated Circuits,
  • Reliability Engineering,
  • Technology,
  • Technology & Industrial Arts,
  • Science/Mathematics

  • Edition Notes

    ContributionsJohn Thong (Editor), M. K. Radhakrishnan (Editor)
    The Physical Object
    FormatPaperback
    Number of Pages209
    ID Numbers
    Open LibraryOL10999388M
    ISBN 100780351878
    ISBN 109780780351875


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